Comparison of Due-date Oriented Dispatch Rules in Semiconductor Manufacturing
نویسنده
چکیده
In this study we compare the cycle-time and on-time-delivery performance of the Critical Ratio (CR), the Earliest Due Date (EDD), and the Operation Due Date (ODD) dispatching rules in semiconductor wafer manufacturing. In addition, we comment on the robustness of the rules to low target flow factor values. It turns out that EDD has almost no positive effect on on-time delivery compared to First-In-First-Out (FIFO) dispatching. CR and ODD, however, reduce the tardiness of lots considerably. ODD dispatching is more robust than CR if the target cycle times for the factory are chosen smaller than the corresponding average cycle times of a factory under FIFO dispatching regime.
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